Dependent microstructure noise and integrated volatility estimation from high-frequency data
Published in Journal of Econometrics, 2020
Studies the impact of dependent microstructure noise on volatility estimation and proposes new estimators.
Recommended citation: Li, Z. M., Laeven, R. J. A., & Vellekoop, M. H. (2020). "Dependent microstructure noise and integrated volatility estimation from high-frequency data." Journal of Econometrics, 215(2), 536–558.
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